Sungho Kim, Myeongwon Lee, Gil-Bok Choi, Jaekwan Lee, Yunbong Lee, Myoungkwan Cho, Kunok Ahn, Jinwoong Kim. RTS noise reduction of 1Y-nm floating gate NAND flash memory using process optimization. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 8, IEEE, 2015. [doi]
Abstract is missing.