External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

A test methodology to screen scan-path failures

Junghwan Kim, Young-Woo Lee, Minho Cheong, Sungyoul Seo, Sungho Kang. A test methodology to screen scan-path failures. In International SoC Design Conference, ISOCC 2016, Jeju, South Korea, October 23-26, 2016. pages 149-150, IEEE, 2016. [doi]

Abstract

Abstract is missing.

runs on