Fault Detection Prediction Using a Deep Belief Network-Based Multi-Classifier in the Semiconductor Manufacturing Process - researchr publication authors

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Jae Kwon Kim, Jong Sik Lee, Youngshin Han. Fault Detection Prediction Using a Deep Belief Network-Based Multi-Classifier in the Semiconductor Manufacturing Process. International Journal of Software Engineering and Knowledge Engineering, 29(8):1125-1139, 2019. [doi]

This author has not been identified. Look up 'Jae Kwon Kim' in GoogleThis author has not been identified. Look up 'Jong Sik Lee' in GoogleThis author has not been identified. Look up 'Youngshin Han' in Google

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