A High Quality Depth Map Upsampling Method Robust to Misalignment of Depth and Color Boundaries - researchr publication authors

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Jaekwang Kim, Jaeho Lee, Seung-Ryong Han, Dowan Kim, Jongsul Min, Changick Kim. A High Quality Depth Map Upsampling Method Robust to Misalignment of Depth and Color Boundaries. VLSI Signal Processing, 75(1):23-37, 2014. [doi]

This author has not been identified. Look up 'Jaekwang Kim' in GoogleThis author has not been identified. Look up 'Jaeho Lee' in GoogleThis author has not been identified. Look up 'Seung-Ryong Han' in GoogleThis author has not been identified. Look up 'Dowan Kim' in GoogleThis author has not been identified. Look up 'Jongsul Min' in GoogleThis author has not been identified. Look up 'Changick Kim' in Google

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