A High Quality Depth Map Upsampling Method Robust to Misalignment of Depth and Color Boundaries

Jaekwang Kim, Jaeho Lee, Seung-Ryong Han, Dowan Kim, Jongsul Min, Changick Kim. A High Quality Depth Map Upsampling Method Robust to Misalignment of Depth and Color Boundaries. VLSI Signal Processing, 75(1):23-37, 2014. [doi]

Abstract

Abstract is missing.