P-backtracking: A new scan chain diagnosis method with probability

Tae-Hyun Kim, Hyunyul Lim, Sungho Kang. P-backtracking: A new scan chain diagnosis method with probability. In International SoC Design Conference, ISOCC 2016, Jeju, South Korea, October 23-26, 2016. pages 141-142, IEEE, 2016. [doi]

Abstract

Abstract is missing.