Taeksu Kim, Chunwoo Lee, Kiljoo Lee, Soohyun Baik, Chisu Wu, Kwangkeun Yi. Test Coverage Metric for Two-Staged Language with Abstract Interpretation. In Shahida Sulaiman, Noor Maizura Mohamad Noor, editors, 16th Asia-Pacific Software Engineering Conference, APSEC 2009, 1-3 December 2009, Batu Ferringhi, Penang, Malaysia. pages 301-308, IEEE Computer Society, 2009. [doi]
@inproceedings{KimLLBWY09,
title = {Test Coverage Metric for Two-Staged Language with Abstract Interpretation},
author = {Taeksu Kim and Chunwoo Lee and Kiljoo Lee and Soohyun Baik and Chisu Wu and Kwangkeun Yi},
year = {2009},
doi = {10.1109/APSEC.2009.46},
url = {http://doi.ieeecomputersociety.org/10.1109/APSEC.2009.46},
tags = {test coverage, testing, coverage},
researchr = {https://researchr.org/publication/KimLLBWY09},
cites = {0},
citedby = {0},
pages = {301-308},
booktitle = {16th Asia-Pacific Software Engineering Conference, APSEC 2009, 1-3 December 2009, Batu Ferringhi, Penang, Malaysia},
editor = {Shahida Sulaiman and Noor Maizura Mohamad Noor},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3909-6},
}