Taeksu Kim, Chunwoo Lee, Kiljoo Lee, Soohyun Baik, Chisu Wu, Kwangkeun Yi. Test Coverage Metric for Two-Staged Language with Abstract Interpretation. In Shahida Sulaiman, Noor Maizura Mohamad Noor, editors, 16th Asia-Pacific Software Engineering Conference, APSEC 2009, 1-3 December 2009, Batu Ferringhi, Penang, Malaysia. pages 301-308, IEEE Computer Society, 2009. [doi]
Abstract is missing.