Geunha Kim, Sehwan Lee, Taeryoung Seol, Seungyeob Baik, Yeonjae Shin, Gain Kim, Jong-Hyeok Yoon, Arup K. George, Junghyup Lee. nd-Order Noise-Shaping SAR-ADC with Enhanced Input Impedance in 0.18μm CMOS. In IEEE International Solid- State Circuits Conference, ISSCC 2023, San Francisco, CA, USA, February 19-23, 2023. pages 484-485, IEEE, 2023. [doi]
@inproceedings{KimLSBSKYGL23,
title = {nd-Order Noise-Shaping SAR-ADC with Enhanced Input Impedance in 0.18μm CMOS},
author = {Geunha Kim and Sehwan Lee and Taeryoung Seol and Seungyeob Baik and Yeonjae Shin and Gain Kim and Jong-Hyeok Yoon and Arup K. George and Junghyup Lee},
year = {2023},
doi = {10.1109/ISSCC42615.2023.10067844},
url = {https://doi.org/10.1109/ISSCC42615.2023.10067844},
researchr = {https://researchr.org/publication/KimLSBSKYGL23},
cites = {0},
citedby = {0},
pages = {484-485},
booktitle = {IEEE International Solid- State Circuits Conference, ISSCC 2023, San Francisco, CA, USA, February 19-23, 2023},
publisher = {IEEE},
isbn = {978-1-6654-9016-0},
}