Taewan Kim, Seyoon Lee, Seunghwan Yun, Jongbum Kim, Okyeon Yi. Analysis of Radioactive Decay Based Entropy Generator in the IoT Environments. In Ilsun You, Taek-Young Youn, editors, Information Security Applications - 23rd International Conference, WISA 2022, Jeju Island, South Korea, August 24-26, 2022, Revised Selected Papers. Volume 13720 of Lecture Notes in Computer Science, pages 277-288, Springer, 2022. [doi]
Abstract is missing.