Analytical alignment for repairing micro patterns on transparent film in roll-to-roll process

HyungTae Kim, Yoon Jae Moon, Heuiseok Kang, Jun Young Hwang. Analytical alignment for repairing micro patterns on transparent film in roll-to-roll process. In IEEE International Conference on Industrial Technology, ICIT 2018, Lyon, France, February 20-22, 2018. pages 1473-1477, IEEE, 2018. [doi]

Authors

HyungTae Kim

This author has not been identified. Look up 'HyungTae Kim' in Google

Yoon Jae Moon

This author has not been identified. Look up 'Yoon Jae Moon' in Google

Heuiseok Kang

This author has not been identified. Look up 'Heuiseok Kang' in Google

Jun Young Hwang

This author has not been identified. Look up 'Jun Young Hwang' in Google