HyungTae Kim, Yoon Jae Moon, Heuiseok Kang, Jun Young Hwang. Analytical alignment for repairing micro patterns on transparent film in roll-to-roll process. In IEEE International Conference on Industrial Technology, ICIT 2018, Lyon, France, February 20-22, 2018. pages 1473-1477, IEEE, 2018. [doi]
Abstract is missing.