Kee Sup Kim, Subhasish Mitra, Paul G. Ryan. Delay Defect Characteristics and Testing Strategies. IEEE Design & Test of Computers, 20(5):8-16, 2003. [doi]
@article{KimMR03,
title = {Delay Defect Characteristics and Testing Strategies},
author = {Kee Sup Kim and Subhasish Mitra and Paul G. Ryan},
year = {2003},
url = {http://csdl.computer.org/comp/mags/dt/2003/05/d5008abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/KimMR03},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {20},
number = {5},
pages = {8-16},
}