Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Dae-Hyun Kim, Jong-Tae Park. Investigation on stress induced hump phenomenon in IGZO thin film transistors under negative bias stress and illumination. Microelectronics Reliability, 55(9-10):1811-1814, 2015. [doi]
Abstract is missing.