Dongsu Kim, Jongsun Park. Low Energy and Error Resilient SOT-MRAM based FPGA LUT Cell. In 18th International SoC Design Conference, ISOCC 2021, Jeju Island, South Korea, Republic of, October 6-9, 2021. pages 77-78, IEEE, 2021. [doi]
@inproceedings{KimP21-17,
title = {Low Energy and Error Resilient SOT-MRAM based FPGA LUT Cell},
author = {Dongsu Kim and Jongsun Park},
year = {2021},
doi = {10.1109/ISOCC53507.2021.9613950},
url = {https://doi.org/10.1109/ISOCC53507.2021.9613950},
researchr = {https://researchr.org/publication/KimP21-17},
cites = {0},
citedby = {0},
pages = {77-78},
booktitle = {18th International SoC Design Conference, ISOCC 2021, Jeju Island, South Korea, Republic of, October 6-9, 2021},
publisher = {IEEE},
isbn = {978-1-6654-0174-6},
}