Ho Joon Kim, Hyun Jung Park, Yun-Seok Cho. A Feature Saliency Measure in WFMM Neural Network-Based Pattern Classification. In Hamid R. Arabnia, Rose Joshua, editors, Proceedings of the 2005 International Conference on Artificial Intelligence, ICAI 2005, Las Vegas, Nevada, USA, June 27-30, 2005, Volume 1. pages 202-207, CSREA Press, 2005.
@inproceedings{KimPC05,
title = {A Feature Saliency Measure in WFMM Neural Network-Based Pattern Classification},
author = {Ho Joon Kim and Hyun Jung Park and Yun-Seok Cho},
year = {2005},
tags = {rule-based, classification},
researchr = {https://researchr.org/publication/KimPC05},
cites = {0},
citedby = {0},
pages = {202-207},
booktitle = {Proceedings of the 2005 International Conference on Artificial Intelligence, ICAI 2005, Las Vegas, Nevada, USA, June 27-30, 2005, Volume 1},
editor = {Hamid R. Arabnia and Rose Joshua},
publisher = {CSREA Press},
isbn = {1-932415-66-1},
}