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A Feature Saliency Measure in WFMM Neural Network-Based Pattern Classification

Ho Joon Kim, Hyun Jung Park, Yun-Seok Cho. A Feature Saliency Measure in WFMM Neural Network-Based Pattern Classification. In Hamid R. Arabnia, Rose Joshua, editors, Proceedings of the 2005 International Conference on Artificial Intelligence, ICAI 2005, Las Vegas, Nevada, USA, June 27-30, 2005, Volume 1. pages 202-207, CSREA Press, 2005.

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