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Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory

Doo-Hyun Kim, Il Han Park, Seongjae Cho, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park. Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory. IEICE Transactions, 92-C(5):659-663, 2009. [doi]

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Doo-Hyun Kim

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Il Han Park

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Seongjae Cho

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Jong Duk Lee

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Hyungcheol Shin

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Byung-Gook Park

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