Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory

Doo-Hyun Kim, Il Han Park, Seongjae Cho, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park. Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory. IEICE Transactions, 92-C(5):659-663, 2009. [doi]

Abstract

Abstract is missing.