Sunkyung Kim, JiSu Park, Kang Hyoun Kim, Jin Gon Shon. A Test Data Generation for Performance Testing in Massive Data Processing Systems. In James J. Park, Vincenzo Loia, Kim-Kwang Raymond Choo, Gangman Yi, editors, Advanced Multimedia and Ubiquitous Engineering - MUE/FutureTech 2018, Salerno, Italy, 23-25 April 2018. Volume 518 of Lecture Notes in Electrical Engineering, pages 207-213, Springer, 2018. [doi]
Abstract is missing.