A Study on the Digital Forensic Investigation Method of Clever Malware in IoT Devices

Dohyun Kim, Yi Pan 0001, Jong Hyuk Park. A Study on the Digital Forensic Investigation Method of Clever Malware in IoT Devices. IEEE Access, 8:224487-224499, 2020. [doi]

Authors

Dohyun Kim

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Yi Pan 0001

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Jong Hyuk Park

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