Suk Min Kim, Byungkyu Song, Seong-Ook Jung. Sensing Margin Enhancement Technique Utilizing Boosted Reference Voltage for Low-Voltage and High-Density DRAM. IEEE Trans. VLSI Syst., 27(10):2413-2422, 2019. [doi]
@article{KimSJ19-0,
title = {Sensing Margin Enhancement Technique Utilizing Boosted Reference Voltage for Low-Voltage and High-Density DRAM},
author = {Suk Min Kim and Byungkyu Song and Seong-Ook Jung},
year = {2019},
doi = {10.1109/TVLSI.2019.2920630},
url = {https://doi.org/10.1109/TVLSI.2019.2920630},
researchr = {https://researchr.org/publication/KimSJ19-0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {27},
number = {10},
pages = {2413-2422},
}