Digital forensic analysis of intelligent and smart IoT devices

Minju Kim, Yeonghun Shin, Wooyeon Jo, Taeshik Shon. Digital forensic analysis of intelligent and smart IoT devices. The Journal of Supercomputing, 79(1):973-997, 2023. [doi]

Authors

Minju Kim

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Yeonghun Shin

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Wooyeon Jo

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Taeshik Shon

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