Minju Kim, Yeonghun Shin, Wooyeon Jo, Taeshik Shon. Digital forensic analysis of intelligent and smart IoT devices. The Journal of Supercomputing, 79(1):973-997, 2023. [doi]
@article{KimSJS23,
title = {Digital forensic analysis of intelligent and smart IoT devices},
author = {Minju Kim and Yeonghun Shin and Wooyeon Jo and Taeshik Shon},
year = {2023},
doi = {10.1007/s11227-022-04639-5},
url = {https://doi.org/10.1007/s11227-022-04639-5},
researchr = {https://researchr.org/publication/KimSJS23},
cites = {0},
citedby = {0},
journal = {The Journal of Supercomputing},
volume = {79},
number = {1},
pages = {973-997},
}