Sungyeon Kim, Minkyo Seo, Ivan Laptev, Minsu Cho, Suha Kwak. Deep Metric Learning Beyond Binary Supervision. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2019, Long Beach, CA, USA, June 16-20, 2019. pages 2288-2297, Computer Vision Foundation / IEEE, 2019. [doi]
Abstract is missing.