Donghyun Kim, Kuniaki Saito, Samarth Mishra, Stan Sclaroff, Kate Saenko, Bryan A. Plummer. Self-supervised Visual Attribute Learning for Fashion Compatibility. In IEEE/CVF International Conference on Computer Vision Workshops, ICCVW 2021, Montreal, BC, Canada, October 11-17, 2021. pages 1057-1066, IEEE, 2021. [doi]
Abstract is missing.