An Effective Defect-Oriented BIST Architecture for High-Speed Phase-Locked Loops

Seongwon Kim, Mani Soma, Dilip Risbud. An Effective Defect-Oriented BIST Architecture for High-Speed Phase-Locked Loops. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 231-236, IEEE Computer Society, 2000. [doi]

Abstract

Abstract is missing.