Sukjin Kim, Radhakrishnan Sithanandam, Woojin Seo, Mijin Lee, Sangyoung Cho, Juho Park, Hyukhoon Kwon, Namho Kim, Chanhee Jeon. Technology Scaling of ESD Devices in State of the Art FinFET Technologies. In 2020 IEEE Custom Integrated Circuits Conference, CICC 2020, Boston, MA, USA, March 22-25, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.