Automatic abnormal log detection by analyzing log history for providing debugging insight

Jinhan Kim, Valeriy Savchenko, Kihyuck Shin, Konstantin Sorokin, Hyunseok Jeon, Georgiy Pankratenko, Sergey Markov, Chul-Joo Kim. Automatic abnormal log detection by analyzing log history for providing debugging insight. In Gregg Rothermel, Doo-Hwan Bae, editors, ICSE-SEIP 2020: 42nd International Conference on Software Engineering, Software Engineering in Practice, Seoul, South Korea, 27 June - 19 July, 2020. pages 71-80, ACM, 2020. [doi]

Abstract

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