Youngho Kim, Yingshi Tian, Yoonjae Jeong, Ryu Jihee, Sung-Hyon Myaeng. Automatic discovery of technology trends from patent text. In Sung Y. Shin, Sascha Ossowski, editors, Proceedings of the 2009 ACM Symposium on Applied Computing (SAC), Honolulu, Hawaii, USA, March 9-12, 2009. pages 1480-1487, ACM, 2009. [doi]
Abstract is missing.