Hyungtak Kim, Alexei Vertiatchikh, Richard M. Thompson, Vinayak Tilak, Thomas R. Prunty, James R. Shealy, Lester F. Eastman. Hot electron induced degradation of undoped AlGaN/GaN HFETs. Microelectronics Reliability, 43(6):823-827, 2003. [doi]
Abstract is missing.