Effects of Charge Traps on Hysteresis in Organic Field-Effect Transistors and Their Charge Trap Cause Analysis through Causal Inference Techniques

Somi Kim, Hochen Yoo, Jaeyoung Choi 0001. Effects of Charge Traps on Hysteresis in Organic Field-Effect Transistors and Their Charge Trap Cause Analysis through Causal Inference Techniques. Sensors, 23(4):2265, February 2023. [doi]

Authors

Somi Kim

This author has not been identified. Look up 'Somi Kim' in Google

Hochen Yoo

This author has not been identified. Look up 'Hochen Yoo' in Google

Jaeyoung Choi 0001

This author has not been identified. Look up 'Jaeyoung Choi 0001' in Google