Effects of Charge Traps on Hysteresis in Organic Field-Effect Transistors and Their Charge Trap Cause Analysis through Causal Inference Techniques - researchr publication

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Somi Kim, Hochen Yoo, Jaeyoung Choi 0001. Effects of Charge Traps on Hysteresis in Organic Field-Effect Transistors and Their Charge Trap Cause Analysis through Causal Inference Techniques. Sensors, 23(4):2265, February 2023. [doi]

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