Junyeap Kim, Hanbin Yoo, Heesung Lee, Seong Kwang Kim, Sungju Choi, Sung Jin Choi, Dae-Hwan Kim, Dong Myong Kim. Comprehensive separate extraction of parasitic resistances in MOSFETs considering the gate bias-dependence and the asymmetric overlap length. Microelectronics Reliability, 85:66-70, 2018. [doi]
@article{KimYLKCCKK18,
title = {Comprehensive separate extraction of parasitic resistances in MOSFETs considering the gate bias-dependence and the asymmetric overlap length},
author = {Junyeap Kim and Hanbin Yoo and Heesung Lee and Seong Kwang Kim and Sungju Choi and Sung Jin Choi and Dae-Hwan Kim and Dong Myong Kim},
year = {2018},
doi = {10.1016/j.microrel.2018.04.011},
url = {https://doi.org/10.1016/j.microrel.2018.04.011},
researchr = {https://researchr.org/publication/KimYLKCCKK18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {85},
pages = {66-70},
}