Junyeap Kim, Hanbin Yoo, Heesung Lee, Seong Kwang Kim, Sungju Choi, Sung Jin Choi, Dae-Hwan Kim, Dong Myong Kim. Comprehensive separate extraction of parasitic resistances in MOSFETs considering the gate bias-dependence and the asymmetric overlap length. Microelectronics Reliability, 85:66-70, 2018. [doi]
Abstract is missing.