A new calibration metric that considers statistical correlation: Marginal Probability and Correlation Residuals

Wongon Kim, Heonjun Yoon, Guesuk Lee, Taejin Kim, Byeng D. Youn. A new calibration metric that considers statistical correlation: Marginal Probability and Correlation Residuals. Rel. Eng. & Sys. Safety, 195:106677, 2020. [doi]

Abstract

Abstract is missing.