Kee Sup Kim, Ming Zhang. Hierarchical Test Compression for SoC Designs. IEEE Design & Test of Computers, 25(2):142-148, 2008. [doi]
@article{KimZ08,
title = {Hierarchical Test Compression for SoC Designs},
author = {Kee Sup Kim and Ming Zhang},
year = {2008},
doi = {10.1109/MDT.2008.39},
url = {http://doi.ieeecomputersociety.org/10.1109/MDT.2008.39},
tags = {testing},
researchr = {https://researchr.org/publication/KimZ08},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {25},
number = {2},
pages = {142-148},
}