Yuta Kimi, Go Matsukawa, Shuhei Yoshida, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto. An accurate soft error propagation analysis technique considering temporal masking disablement. In 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015. pages 23-25, IEEE, 2015. [doi]
@inproceedings{KimiMYIKY15,
title = {An accurate soft error propagation analysis technique considering temporal masking disablement},
author = {Yuta Kimi and Go Matsukawa and Shuhei Yoshida and Shintaro Izumi and Hiroshi Kawaguchi and Masahiko Yoshimoto},
year = {2015},
doi = {10.1109/IOLTS.2015.7229822},
url = {http://dx.doi.org/10.1109/IOLTS.2015.7229822},
researchr = {https://researchr.org/publication/KimiMYIKY15},
cites = {0},
citedby = {0},
pages = {23-25},
booktitle = {21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7905-2},
}