Pairwise Testing in the Presence of Configuration Change Cost - researchr publication authors

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Shin Kimoto, Tatsuhiro Tsuchiya, Tohru Kikuno. Pairwise Testing in the Presence of Configuration Change Cost. In Second International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008, July 14-17, 2008, Yokohama, Japan. pages 32-38, IEEE Computer Society, 2008. [doi]

This author has not been identified. Look up 'Shin Kimoto' in GoogleThis author has not been identified. Look up 'Tatsuhiro Tsuchiya' in GoogleThis author has not been identified. Look up 'Tohru Kikuno' in Google

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