Shuta Kimura, Masanori Hashimoto, Takao Onoye. Body bias clustering for low test-cost post-silicon tuning. In Proceedings of the 17th Asia and South Pacific Design Automation Conference, ASP-DAC 2012, Sydney, Australia, January 30 - February 2, 2012. pages 283-289, IEEE, 2012. [doi]
Abstract is missing.