Roshan L. Kini, Shankar Dhakal, Sadab Mahmud, Andrew J. Sellers, Michael R. Hontz, Cheikh A. Tine, Raghav Khanna. An Investigation of Frequency Dependent Reliability and Failure Mechanism of pGaN Gated GaN HEMTs. IEEE Access, 8:137312-137321, 2020. [doi]
@article{KiniDMSHTK20,
title = {An Investigation of Frequency Dependent Reliability and Failure Mechanism of pGaN Gated GaN HEMTs},
author = {Roshan L. Kini and Shankar Dhakal and Sadab Mahmud and Andrew J. Sellers and Michael R. Hontz and Cheikh A. Tine and Raghav Khanna},
year = {2020},
doi = {10.1109/ACCESS.2020.3011453},
url = {https://doi.org/10.1109/ACCESS.2020.3011453},
researchr = {https://researchr.org/publication/KiniDMSHTK20},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {8},
pages = {137312-137321},
}