Roshan L. Kini, Shankar Dhakal, Sadab Mahmud, Andrew J. Sellers, Michael R. Hontz, Cheikh A. Tine, Raghav Khanna. An Investigation of Frequency Dependent Reliability and Failure Mechanism of pGaN Gated GaN HEMTs. IEEE Access, 8:137312-137321, 2020. [doi]
Abstract is missing.