Anjali Kinra, Aswin Mehta, Neal Smith, Jackie Mitchell, Fred Valente. Diagnostic techniques for the UltraSPARC microprocessors. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 480-486, IEEE Computer Society, 1998. [doi]
@inproceedings{KinraMSMV98,
title = {Diagnostic techniques for the UltraSPARC microprocessors},
author = {Anjali Kinra and Aswin Mehta and Neal Smith and Jackie Mitchell and Fred Valente},
year = {1998},
url = {http://www.computer.org/proceedings/itc/5093/50930480abs.htm},
tags = {diagnostics},
researchr = {https://researchr.org/publication/KinraMSMV98},
cites = {0},
citedby = {0},
pages = {480-486},
booktitle = {Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998},
publisher = {IEEE Computer Society},
isbn = {0-7803-5093-6},
}