Josef Kinseher, Leonardo Bonet Zordan, Ilia Polian, Andreas Leininger. Improving SRAM test quality by leveraging self-timed circuits. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 984-989, IEEE, 2016. [doi]
@inproceedings{KinseherZPL16,
title = {Improving SRAM test quality by leveraging self-timed circuits},
author = {Josef Kinseher and Leonardo Bonet Zordan and Ilia Polian and Andreas Leininger},
year = {2016},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7459450},
researchr = {https://researchr.org/publication/KinseherZPL16},
cites = {0},
citedby = {0},
pages = {984-989},
booktitle = {2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016},
editor = {Luca Fanucci and Jürgen Teich},
publisher = {IEEE},
isbn = {978-3-9815-3707-9},
}