Two-sample Testing Using Deep Learning

Matthias Kirchler, Shahryar Khorasani, Marius Kloft, Christoph Lippert. Two-sample Testing Using Deep Learning. In Silvia Chiappa, Roberto Calandra, editors, The 23rd International Conference on Artificial Intelligence and Statistics, AISTATS 2020, 26-28 August 2020, Online [Palermo, Sicily, Italy]. Volume 108 of Proceedings of Machine Learning Research, pages 1387-1398, PMLR, 2020. [doi]

Abstract

Abstract is missing.