Specification-based Verification of Embedded Systems by Automated Test Case Generation

Christoph M. Kirchsteiger, Christoph Trummer, Christian Steger, Reinhold Weiss, Markus Pistauer. Specification-based Verification of Embedded Systems by Automated Test Case Generation. In Bernd Kleinjohann, Lisa Kleinjohann, Wayne Wolf, editors, Distributed Embedded Systems: Design, Middleware and Resources, IFIP 20th World Computer Congress, TC10 Working Conference on Distributed and Parallel Embedded Systems (DIPES 2008), September 7-10, 2008, Milano, Italy. Volume 271 of IFIP, pages 35-44, Springer, 2008. [doi]

Abstract

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