Optimized Test Error Detection by Probabilistic Retest Recommendation Models

Matthias Kirmse, Uwe Petersohn, Elief Paffrath. Optimized Test Error Detection by Probabilistic Retest Recommendation Models. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 317-322, IEEE Computer Society, 2011. [doi]

Authors

Matthias Kirmse

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Uwe Petersohn

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Elief Paffrath

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