Substrate-induced high-frequency noise in deep sub-micron MOSFETs for RF applications - researchr publication authors

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S. V. Kishore, Glenn Chang, Georgios Asmanis, Chris Hull, Frederic Stubbe. Substrate-induced high-frequency noise in deep sub-micron MOSFETs for RF applications. In Proceedings of the IEEE 1999 Custom Integrated Circuits Conference, CICC 1999, San Diego, CA, USA, May 1649,1999. pages 365-368, IEEE, 1999. [doi]

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