Real-time dynamic range and signal to noise enhancement in beam-scanning microscopy by integration of sensor characteristics, data acquisition hardware, and statistical methods

David J. Kissick, Ryan D. Muir, Shane Z. Sullivan, Robert A. Oglesbee, Garth J. Simpson. Real-time dynamic range and signal to noise enhancement in beam-scanning microscopy by integration of sensor characteristics, data acquisition hardware, and statistical methods. In Charles A. Bouman, Ilya Pollak, Patrick J. Wolfe, editors, Computational Imaging XI, part of the IS&T-SPIE Electronic Imaging Symposium, Burlingame, California, USA, February 3, 2013, Proceedings. Volume 8657 of SPIE Proceedings, IS&T/SPIE, 2013. [doi]

Abstract

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