Tuba Kiyan, Christof Brillert, Christian Boit. Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in externally triggered pulsing condition. Microelectronics Reliability, 48(8-9):1327-1332, 2008. [doi]
@article{KiyanBB08,
title = {Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in externally triggered pulsing condition},
author = {Tuba Kiyan and Christof Brillert and Christian Boit},
year = {2008},
doi = {10.1016/j.microrel.2008.07.028},
url = {http://dx.doi.org/10.1016/j.microrel.2008.07.028},
tags = {analysis, design},
researchr = {https://researchr.org/publication/KiyanBB08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {8-9},
pages = {1327-1332},
}